Non più in commercio
Angewandte Oberflächenanalyse mit SIMS Sekundär-Ionen- Massenspektrometrie, AES Aufer-Elektronen-Spektrometrie, XPS, Röntgen-Photoelektronen-Spektrometrie
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di M. Grasserbauer, H.J. Dudek, Maria F. Ebel (Autori)
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Dettagli
| Edizione: | 1 |
|---|---|
| Categoria: | Chemistry |
| Volumi: | 0 |
| Pagine: | 0 |
| Collana: | - |
| Data Pubblicazione: | -1986 |
| Lingua: | Ger |
| ISBN: | 9783642701788 |
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